smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.2-STABLE amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint M6
Device Model:     SAMSUNG HM320JI
Serial Number:    --
LU WWN Device Id: 5 0f0000 ...
Firmware Version: 2SS00_01
User Capacity:    320,072,933,376 bytes [320 GB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database 7.3/5319
ATA Version is:   ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 0
SATA Version is:  SATA 2.5, 1.5 Gb/s
Local Time is:    Thu Aug  3 12:14:59 2023 BST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM level is:     128 (quiet), recommended: 254
APM feature is:   Disabled
Rd look-ahead is: Enabled
Write cache is:   Enabled
DSN feature is:   Unavailable
ATA Security is:  Disabled, frozen [SEC2]
Wt Cache Reorder: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (  32)	The self-test routine was interrupted
					by the host with a hard or soft reset.
Total time to complete Offline 
data collection: 		(  121) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 121) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
  1 Raw_Read_Error_Rate     POSR--   100   100   051    -    32
  3 Spin_Up_Time            POS---   252   252   025    -    2812
  4 Start_Stop_Count        -O--CK   084   084   000    -    16973
  5 Reallocated_Sector_Ct   PO--CK   095   095   010    -    53
  7 Seek_Error_Rate         POSR--   252   252   051    -    0
  8 Seek_Time_Performance   --S--K   252   252   015    -    0
  9 Power_On_Hours          -O--CK   058   058   000    -    21332
 10 Spin_Retry_Count        -O--CK   100   100   051    -    5
 12 Power_Cycle_Count       -O--CK   092   092   000    -    8796
191 G-Sense_Error_Rate      -O--CK   002   002   000    -    999999
192 Power-Off_Retract_Count -O--CK   100   100   000    -    1224
194 Temperature_Celsius     -O---K   091   040   000    -    49 (Min/Max 5/66)
195 Hardware_ECC_Recovered  -O-RC-   100   001   000    -    6351
196 Reallocated_Event_Count -O--CK   252   252   000    -    0
197 Current_Pending_Sector  -O--C-   252   252   000    -    0
198 Offline_Uncorrectable   ----CK   252   252   000    -    0
199 UDMA_CRC_Error_Count    -OS-CK   200   200   000    -    2
200 Multi_Zone_Error_Rate   -O-R--   100   100   000    -    0
201 Soft_Read_Error_Rate    -O--CK   252   252   000    -    0
223 Load_Retry_Count        -O--CK   098   098   000    -    2253
225 Load_Cycle_Count        -O--CK   028   028   000    -    732535
                            ||||||_ K auto-keep
                            |||||__ C event count
                            ||||___ R error rate
                            |||____ S speed/performance
                            ||_____ O updated online
                            |______ P prefailure warning

General Purpose Log Directory Version 1
SMART           Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00       GPL,SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x02           SL  R/O      2  Comprehensive SMART error log
0x03       GPL     R/O      2  Ext. Comprehensive SMART error log
0x06           SL  R/O      1  SMART self-test log
0x08           SL  R/O      1  Power Conditions log
0x10       GPL     R/O      1  NCQ Command Error log
0x11       GPL     R/O      1  SATA Phy Event Counters log
0x80       GPL,SL  R/W     16  Host vendor specific log
0x81-0x9f      SL  R/W     16  Host vendor specific log
0xe0       GPL,SL  R/W      1  SCT Command/Status
0xe1       GPL,SL  R/W      1  SCT Data Transfer

SMART Extended Comprehensive Error Log Version: 1 (2 sectors)
Device Error Count: 7
	CR     = Command Register
	FEATR  = Features Register
	COUNT  = Count (was: Sector Count) Register
	LBA_48 = Upper bytes of LBA High/Mid/Low Registers ]  ATA-8
	LH     = LBA High (was: Cylinder High) Register    ]   LBA
	LM     = LBA Mid (was: Cylinder Low) Register      ] Register
	LL     = LBA Low (was: Sector Number) Register     ]
	DV     = Device (was: Device/Head) Register
	DC     = Device Control Register
	ER     = Error register
	ST     = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

ATA_READ_LOG_EXT (addr=0x03:0x00, page=1, n=1) failed: Input/output error
SMART Extended Self-test Log (GP Log 0x07) not supported

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Status Version:                  2
SCT Version (vendor specific):       256 (0x0100)
Device State:                        Active (0)
Current Temperature:                    49 Celsius
Power Cycle Min/Max Temperature:     46/49 Celsius
Lifetime    Min/Max Temperature:      7/67 Celsius
Under/Over Temperature Limit Count:   0/0

SCT Temperature History Version:     2
Temperature Sampling Period:         1 minute
Temperature Logging Interval:        1 minute
Min/Max recommended Temperature:     15/55 Celsius
Min/Max Temperature Limit:           10/60 Celsius
Temperature History Size (Index):    128 (73)

SCT Error Recovery Control:
           Read: Disabled
          Write: Disabled

Device Statistics (GP/SMART Log 0x04) not supported

Pending Defects log (GP Log 0x0c) not supported

SATA Phy Event Counters (GP Log 0x11)
ID      Size     Value  Description
0x0001  2            0  Command failed due to ICRC error
0x000a  2            1  Device-to-host register FISes sent due to a COMRESET
0x0008  2            0  Device-to-host non-data FIS retries
0x0009  2            0  Transition from drive PhyRdy to drive PhyNRdy
0x000b  2            0  CRC errors within host-to-device FIS
0x000d  2            0  Non-CRC errors within host-to-device FIS
0x8001  2            0  Vendor specific

